The Electric High Temperature Aging Testing Machine / Chamber
Fiber Optic Aging Testing Machine / Chamber are engineered specifically for applications such as high
dissipation forward bias, high-temperature reverse bias, dynamic
and static burn-in of IC, RAM, ROM, microprocessors and other
semiconductor devices. Aging test machine are designed for dynamic
and static burn-in of integrated circuits and other electronic
devices, including laser diodes.
Aging test chamber for usb asic uses elevated voltages,
temperatures and power cycling to evaluate high power chips, boards
or products. Also the equipment is used by semiconductor
manufacturers to test the quality of an integrated circuit (IC),
printed circuit board (PCB), application-specific integrated
circuits (ASICs), and other microprocessors. And may also be known
as life testing equipment, and so on.
Micro Control’s Burn-in Accessories includes the Burn-In Prescreen
Station which is for the use of Micro Control's burn-in systems.
It's equipped with an open design for easy access to test points
for single-board testing.
The LC-2 Prescreen Station holds one burn-in board. Access to the
test electronics and power supplies make troubleshooting burn-in
boards, as well as, designing and running test programs.